Which Linux distro are you using? Fedora
Which release version? 43
Which kernel are you using? 6.17.8
Which BIOS version are you using? 0.0.3.3
Which Framework Laptop 13 model are you using? AMD Ryzen™ AI 300 Series
The SMART data in my Crucial P310 seems to be showing very abnormal SMART data. This is a replacement - the same issue happened a while ago - so it probably isn’t that I have a bunk drive. Specifically, the power cycles and unsafe shutdowns are impossibly high.
SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff)
Critical Warning: 0x00
Temperature: 21 Celsius
Available Spare: 100%
Available Spare Threshold: 5%
Percentage Used: 19%
Data Units Read: 815,815 [417 GB]
Data Units Written: 1,602,304 [820 GB]
Host Read Commands: 8,096,065
Host Write Commands: 22,002,864
Controller Busy Time: 1
Power Cycles: 111,644
Power On Hours: 100
Unsafe Shutdowns: 111,081
Media and Data Integrity Errors: 0
Error Information Log Entries: 0
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 21 Celsius
Has anyone had any other issues with this or know how to fix it? I understand that it may not actually affect the durability of the drive, but it increases the “Percentage used” stat, as can be seen above, which eventually leads the drive to be marked as undergoing imminent failure in software. I have tried enabling nvme.noacpi in GRUB but that breaks wake from sleep.